Dr. Matthias Weißer

2024

• Magerl A., Lemmel H., Appel M., Weißer M., Kretzer U., Zobel M.:
  The promise of GaAs 200 in small-angle neutron scattering for higher resolution
  In: Journal of Applied Crystallography 57 (2024), p. 1282-1287
  ISSN: 0021-8898
  DOI: 10.1107/S1600576724007246
  BibTeX: Download
• Shahzad A., Yang F., Steffen J., Neiß C., Panchenko A., Götz K., Vogel C., Weißer M., Embs JP., Petry W., Lohstroh W., Görling A., Goychuk I., Unruh T.:
  Atomic diffusion in liquid gallium and gallium-nickel alloys probed by quasielastic neutron scattering and molecular dynamic simulations
  In: Journal of Physics: Condensed Matter 36 (2024), Article No.: 175403
  ISSN: 0953-8984
  DOI: 10.1088/1361-648X/ad1e9f
  BibTeX: Download

2023

• Wittkämper H., Hock R., Weißer M., Dallmann J., Vogel C., Raman N., Tacardi N., Haumann M., Wasserscheid P., Hsieh TE., Maisel S., Moritz M., Wichmann C., Frisch J., Gorgoi M., Wilks RG., Bär M., Wu M., Spiecker E., Görling A., Unruh T., Steinrück HP., Papp C.:
  Isolated Rh atoms in dehydrogenation catalysis
  In: Scientific Reports 13 (2023), p. 4458-
  ISSN: 2045-2322
  DOI: 10.1038/s41598-023-31157-y
  BibTeX: Download
• Wittkämper H., Hock R., Weißer M., Dallmann J., Vogel C., Raman N., Taccardi N., Haumann M., Wasserscheid P., Hsieh TE., Maisel S., Moritz M., Wichmann C., Frisch J., Gorgoi M., Wilks RG., Bär M., Wu M., Spiecker E., Görling A., Unruh T., Steinrück HP., Papp C.:
  Author Correction: Isolated Rh atoms in dehydrogenation catalysis (Scientific Reports, (2023), 13, 1, (4458), 10.1038/s41598-023-31157-y)
  In: Scientific Reports 13 (2023), Article No.: 9588
  ISSN: 2045-2322
  DOI: 10.1038/s41598-023-35778-1
  BibTeX: Download

2021

• Rühl M., Lehmeyer J., Nagy R., Weißer M., Bockstedte M., Krieger M., Weber HB.:
  Removing the orientational degeneracy of the TS defect in 4H-SiC by electric fields and strain
  In: New Journal of Physics 23 (2021), Article No.: 073002
  ISSN: 1367-2630
  DOI: 10.1088/1367-2630/abfb3e
  URL: https://iopscience.iop.org/article/10.1088/1367-2630/abfb3e
  BibTeX: Download

2020

• Wicht T., Mueller S., Weingaertner R., Epelbaum B., Besendoerfer S., Blaess U., Weißer M., Unruh T., Meißner E.:
  X-ray characterization of physical-vapor-transport-grown bulk AlN single crystals
  In: Journal of Applied Crystallography 53 (2020), p. 1080-1086
  ISSN: 0021-8898
  DOI: 10.1107/S1600576720008961
  BibTeX: Download

2015

• Brkljaca Z., Klimczak M., Milicevic Z., Weißer M., Taccardi N., Wasserscheid P., Smith DM., Magerl A., Smith AS.:
  Complementary Molecular Dynamics and X-ray Reflectivity Study of an Imidazolium-Based Ionic Liquid at a Neutral Sapphire Interface
  In: Journal of Physical Chemistry Letters 6 (2015), p. 549--555
  ISSN: 1948-7185
  DOI: 10.1021/jz5024493
  BibTeX: Download

2014

• Bergmann C., Will J., Gröschel A., Weißer M., Magerl A.:
  Radial oxygen precipitation of a 12 '' CZ silicon crystal studied in-situ with high energy X-ray diffraction
  In: physica status solidi (a) 211 (2014), p. 2450-2454
  ISSN: 1862-6300
  DOI: 10.1002/pssa.201400062
  BibTeX: Download
• Will J., Gröschel A., Bergmann C., Weißer M., Magerl A.:
  Growth and nucleation regimes in boron doped silicon by dynamical x-ray diffraction
  In: Applied Physics Letters 105 (2014)
  ISSN: 0003-6951
  DOI: 10.1063/1.4896184
  BibTeX: Download

2011

• Will J., Gröschel A., Weißer M., Magerl A.:
  Thickness dependence of the integrated Bragg intensity for statistically disturbed silicon crystals
  In: Applied Physics Letters 98 (2011)
  ISSN: 0003-6951
  DOI: 10.1063/1.3531761
  BibTeX: Download

2004

• Weißer M., Seitz C., Wellmann P., Hock R., Magerl A.:
  Structural defects in SiC crystals investigated by high energy x-ray diffraction
  In: Materials Science Forum 457-460 (2004), p. 339-342
  ISSN: 0255-5476
  DOI: 10.4028/www.scientific.net/MSF.457-460.339
  BibTeX: Download